Plan to Join Micro-Poise at Tire Technology Expo 2013

January 15, 2013

Make your plans now to meet with Micro-Poise at Booth 1090 in Cologne, Germany for Tire Technology Expo 2013.  The conference begins on Tuesday, February 5 and continues through February 7, 2013. It is the world’s biggest celebration of tire excellence. 

Meet with our Chief Technology Officer, Dr. Shaun Immel. Dr. Immel is presenting a paper on Tuesday, February 5th at the conference titled Closing the Loop Around Tire Production – The Next Frontier. This presentation will highlight Micro-Poise’s TAURUSTM and ATLISTM Systems.  

Plan to visit with Jose Caceres and Moath Al-Shyoukh to talk about Automatic Defect Recognition (ADR) and X-Ray solutions.  Mr. Caceres is presenting a paper on Wednesday, February 6th at the conference titled X-ray technologies in the field of tire manufacturing. Mr. Al- Shyoukh is presenting a paper on Wednesday, February 6th at the conference titled ADR - Measuring tires by X-ray without calibration.  

Plan to discuss with our industry experts the most recent tire innovations in the Next Generation of Modular Tire Measurement Systems, Uniformity Testing, Dynamic Balancers and X-Ray machinery.  

Come talk with our aftermarket specialists on the latest products that can help maximize the life of your equipment.    

We look forward to meeting you in Cologne to discover why The World is Turning to Micro-Poise for all their Final Finish Tire Testing needs. 

Best Regards,

Kara Kozlowski
Sales & Marketing Associate
Micro-Poise Measurement Systems
555 Mondial Parkway
Streetsboro, Ohio 44241-4510
Main: 1-330-541-9100
Fax: 1-330-541-9111