Join Us at Tire Tech Expo 2012

February 1, 2012

Meet with Micro-Poise’s Tire Industry Experts at Booth 8120 in Cologne, Germany for Tire Technology Expo 2012 beginning February 14 through February 16, 2012. Meet with our Chief Technology Officer, Dr. Shaun Immel. Dr Immel is presenting two papers on Tuesday at the conference. They are titled The Next Generation of Modular Tire Measurement Systems (MTMS) and the Application of Effective Radius Measurement in tire production. Our booth will
feature our new Intelli-Sense Modular Instrumentation, AkroMARK PLUS™, VerTiX X-Ray machinery and Coll-Tech X-Ray ADR products.

Mr. Andre Kollmeier is presenting a paper on Tuesday titled New Innovations in Tire X-Ray technology.Visit with Moath Al-Shyoukh and discuss our software for Automatic Defect Recognition (ADR).

Visit with our skilled Industry leaders and click here to discover why The World is Turning to Micro-Poise for all their Final Finish Tire Testing needs.

We look forward to seeing you at the show.

Best Regards,

Kara Kozlowski
Marketing Associate
Micro-Poise Measurement Systems
555 Mondial Parkway
Streetsboro, Ohio 44241-4510
Main: 1-330-541-9100
Fax: 1-330-541-9111