Join Micro-Poise at ITEC 2012

September 11, 2012


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Plan now to visit Micro-Poise at Booth 730 and discuss all your final finish tire testing needs. International Tire Exhibition & Conference (ITEC) will be held at the I-X Center in Cleveland, Ohio beginning September 18th and continuing through September 20th.  

Meet with Mr. Mark Muroski as he is presenting two papers on Tuesday at the conference. They are title The Next Generation of Modular Tire Measurement Systems (MTMS) and the Application of Effective Radius Measurement in tire production.

Mr. José Cáceres is presenting a paper on Tuesday at the conference. It is titled Automatic Defect Recognition (ADR) State of the Art Tire X-Ray technology. Visit José Cáceres and discuss our innovative software technology available for the tire industry.  

Visit with our skilled Industry leaders and Click here to discover why The World is Turning to Micro-Poise.

Best Regards,

Kara Kozlowski
Sales & Marketing Associate
Micro-Poise Measurement Systems
555 Mondial Parkway
Streetsboro, Ohio 44241-4510
Main: 1-330-541-9100
Fax: 1-330-541-9111